1998 Fall Technical Conference Program

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Thursday, October 22, 1998

Thursday 7:30-

Registration Desk Opens

Thursday 8:00-9:00

WELCOME / PLENARY SESSION
Topic: Managment Analytics: What Is This All About?
Speaker: Patrick P. Donnelly, Drexel University
Welcome: Dot Sempolinski, Corning Inc.

Thursday 9:15-10:00

A. Waveletes and Statistical Process Control B. Multiresponse Optimization C. Quality Management Case Study

1

Multiscale Statistical Process Control Using Wavelets
Bhavik Bakshi, Ohio State University
A Hierarchical Method for Multiresponse Experiments where Some Outcomes are Assessed by Sensory Panel Data
Flavio S. Fogliatto,
Federal University of Rio Grande do Sul, Brazil
Quality Management and Quality Assurance in the Manufacturing of Nuclear Fuel Elements: Trends and Challenges
Yves Grize, AICOS Technologies AG
Moderator: Greg Page
Corning Inc.
Moderator: Mary Ann Koskinen
Campbell Soup Company
Moderator: Heidi Servilla
Corning Inc.

Thursday 10:00-10:30

COFFEE BREAK

Thursday 10:30-12:00

A. Small Sample SPC B. Special Invited Session on Chemometrics C. Screening Designs

2

Small Sample Theory for Change Detection Using 'Time Between' Data
Richard E. Kleinknecht, Weyerhaeuser Company
Making Money for The Dow Chemical Company Using Chemometrics
Mary Beth Seasholtz, The Dow Chemical Company
Use of Replication in Almost Unreplicated Factorials
Kinley Larntz, University of Minnesota
Small Sample Properties of an Adaptive Filter with Application to Low Volume Statistical Process Control
Larry Eshleman, Cornell University
The Potential of the Wavelet Transform for Data Processing in Analytical Chemistry
Christian MitterMayr, University of Delaware
Minimizing Prediction Error in Models Fitted to Experiments with 16 Factorial Points and 0 to 6 Center Point
Arthur Holms, Private Consultant
Moderator: Dean Neubauer
Corning Inc.
Moderator: Robert Brill
Solutia, Inc.
Moderator: Ralph St. John
Bowling Green State Univ.

Thursday 12:15-1:45

LUNCHEON
Topic: Manufacturing Process Control & Discipline
Speaker: John Rathmell, Manager of Manufacturing Process Engineering, Corning Inc.
Presiding: Kymm K. Hockman, DuPont Co., ASQ-C&PID Chair

Thursday 2:00-3:30

A. Multivariate Control Charts B. JQT Session C. Case Studies

3

Robust Multivariate Control Charts
Vivek Ajmani, University of Florida
What I Think Response Surface Methods are All About
George Box, University of Wisconsin, Madison
Regression Control Charts Revisited: Methodology and Case Study
Bryan Olin, The Proctor and Gamble Company
Run-to-Run Batch Process Monitoring Using Real-Time Data
Todd Nelson, 3M
Response Surface Methodology: Reflections of the Past and Future Directions
Raymond Myers, Virginia Polytechnic Institute and State University
Uncertainties in Quantitative Measures of Statistical Reliability of a Fatigue Loaded Component
Donald Neal, SRRC
Moderator: Bob Mitchell, 3M Moderator: Goeff Vining, Editor, JQT,
University of Florida
Moderator: Athan Marion
Campbell Soup Company

Thursday 4:00-5:00

W. J. YOUDEN ADDRESS
Topic: A Perspective on Models and the Quality Sciences: Some Challenges and Future Directions
Speaker: Doug Montgomery, Arizona State University
Presiding: Don Williams, Process Improvement Consultants, ASQ-STAT Chair



Friday, October 23, 1998

Friday 8:00

Registration Desk Opens

Friday 8:30-10:00

A. Frontiers in Modelling B. Quality Assessment C. CUSUM Control Charts

1

Joint Estimation of Location, Dispersion, and Random Effects in Robust Design
Russ Wolfinger, SAS Institute Inc.
Computer Simulation: A Decision Tool for Quality Planning
Soumaya Yacout, Universite de Moncton
Using CUSUM Charts to Identify the Start of a Problem
Wayne Taylor, Baxter Healthcare Corporation
Latent Variable Multivariate Regression Modeling
Alison Burnham, McMaster University
Process Indices for Certain Non-Stable Processes
Joseph Voelkel, Rochester Institute of Technology
Unified CUSUM Charts for Monitoring Process Mean and Variability under Univariate and Multivariate Processes
Chandramouliswaran Venkataramani, Bowling Green State University
Moderator: John Cornell
University of Florida
Moderator: Raymond Brown
Drexel University
Moderator: Michael Saccucci
BBN Software, Inc.

Friday 10:00-10:30

COFFEE BREAK

Friday 10:30-12:00

A. Technometrics Session B. Massive Data Sets C. Extensions to Control Charts

2

Constructing Split Lot Designs
Robert Mee, University of Tennesee
Process Partitions for Massive Datasets
George Runger, Arizona State University
The Box-chart: A New Variable Control Chart for Univariate and Multivariate Processes
Arthur Yeh, Bowling Green State University
Cost Driven Parameter Design
C.F.J. Wu, University of Michigan
An Embarrassment of Riches: Design and Analysis of a 4000 Run Experiment
Bert Gunter, Merck and Company
Control Limits for CV Control Charts Via Simulation
Joseph Conklin, General Motors
Moderator: Max D. Morris, Editor Technometrics,
Oak Ridge National Laboratory
Moderator: Robin Wurl
Rutgers University
Moderator: Jonathan Burton
Drexel University

Friday 12:15-1:45

LUNCHEON
Topic: Quality, Statisticians, and Universities
Speaker: David S. Moore, ASA President, Purdue University
Presiding: John Cornell, University of Florida, ASA-SPES Chair

Friday 2:00-3:30

A. Special Issues in DOE B. Reliability C. Special Issues in SPC

3

Optimal Design Strategies for Experiments Involving Noise Variables
Connie Borror, Arizona State University
Analysis of Product Repair Data
Wayne Nelson, Consultant
Monitoring Processes with Censored Data
Stefan Steiner, University of Waterloo
Designing Two-Level Factorial Experiments in Blocks when Effects May Change Over Time
Mary Leitnaker, University of Tennesee
Statistical Tolerance Analysis with Time Effects
Nicholas Zaino, Reliability Consultant
Some Guidelines for the Application of Adaptive Control Charting Schemes
Lora Zimmer, Arizona State University
Moderator: James Stuart
Eastman Kodak, Inc.
Moderator: John Heitmann
Corning Inc.
Moderator: Jay S. Kim
Loma Linda University

Officers of Sponsoring Organizations

ASQ - C&PID

ASQ - Stat

ASA - SPES

Chair: Kymm Hockman, DuPont Company
Chair-Elect: Dorothy Sempolinski, Corning Inc.
Secretary: William Cox, TQM Consulting
Treasurer: Jim Stuart, Eastman Chemical Company
Chair: Don Williams, Process Improvement Consultants
Chair-Elect: Robert Mitchell, 3M
Secretary: Van Bowen, Univ. of Richmond
Treasurer: Janice Shade, Nabisco
Chair: John Cornell, University of Florida
Chair-Elect: Janet Buckingham, Southwest Research Institute
Secretary/Treasurer: Perry Haaland, Becton Dickinson Research Center

1998 Fall Technical Conference Committee

General Conference Chair:

Dorothy Sempolinski, Corning Inc.

Local Conference Chair:

Dorothy Sempolinski, Corning Inc.

Treasurer:

Brenda Niccum, Corning Inc.

Registration:

Marianne Abercrombie, Corning Inc.

Host Committee:

Carolyn Clark - Corning Inc.
Jan Johnson - Corning Inc.
Dean Neubauer - Corning Inc.

Program Committee:

Randy Tobias, SAS Institute, Inc. (ASA-SPES)
Malcolm Hazel, Campbell Soup Company (ASQ-C&PID)
Bob Brill, Solutia Inc. (ASQ-STAT)

This page sponsored by SAS Institute.