1992 Gordon Research Conference on Statistics in Chemistry and Chemical Engineering

Hew Hampton School, New Hampton, NH

July 27 to July 31, 1992

Chair: Richard D. De Veaux, Princeton University

Vice Chair: Roger W. Hoerl, Scott Paper Company

1) Speaker: John F MacGregor, McMaster University, Ontario, Canada

Topic: Multivariate Methods for Process Analysis

Discussant: Svante Wold, Umea University, Sweden

Moderator: Karen Kafadar, National Cancer Institute

2) Speaker: Adrian F.M. Smith, Imperial College, London, UK

Topic: Bayesian Methods for Reliability

Discussant: Bruce Hoadley, Bellcore

Moderator: Edward I. George, University of Chicago

3) Speaker: Ingram Olkin, Stanford University

Topic: Meta Analysis in Science

Discussant: Donald B. Rubin, Harvard University

Moderator: Donna F. Stroup, Centers for Disease Control

4) Speaker: Lyle H. Ungar, University of Pennsylvania

Topic: Neural Networks for Chemical Process Control

Discussant: James M. Minor, Dupont

Moderator: Roger W. Hoerl, Scott Paper Company

5) Speaker: Trevor J. Hastie, AT&T Bell Laboratories

Topic: Generalized Additive Models and Classification

Discussant: Anthony C. Atkinson, London School of Economics, UK

Moderator: Diane E. Duffy, Bellcore

6) Speaker: Philip K. Hopke, Clarkson University

Topic: Multivariate Methods for Environmental Chemical Analysis

Discussant: Nouna Kettaneh-Wold, MDS Inc.

Moderator: Age Smilde, University Center for Pharmacy, Groningen, Netherlands

7) Speaker: V.V. Fedorov, Academy of Sciences, Moscow, Russia

Topic: Moving regression: analysis and design of experiments

Discussant: Toby J. Mitchell, Oak Ridge National Laboratory

Moderator: James M. Lucas, Consultant

8) Speaker: John C. Bailar, McGill University, Quebec, Canada

Topic: New Direction in Risk Assessment

Discussant: J. Michael Steele, University of Pennsylvania

Moderator: Karen J. Hyver, Baxter Diagnostics Inc.

9) Speaker: Deborah F. Swayne, Bellcore and Martin Koschat, Yale

Topic: Interactive Statistical Graphics using the X Window System

Discussant: Randall D. Tobias, SAS Institute

Moderator: Karen J. Bandeen-Roche, Johns-Hopkins University

Conference Portrait