1993 Gordon Research Conference on Statistics in Chemistry and Chemical Engineering

New Hampton School, New Hampton, NH

July 26 to July 30, 1993

Chair: Roger W. Hoerl, Scott Paper Company

Vice Chair: Svante Wold, Umea University, Sweden

Speaker: Dick DeVeaux, Princeton University

Topic: MARS, Nets, PLS, and All That Jazz; A Data Analytic Perspective

Discussant: Diane Duffy, Bellcore

Moderator: Lynne Hare, T. J. Lipton

Speaker: Lloyd Currie, NIST

Topic: Statistical and Chemical Issues in Detection and Environmental Modelling

Discussant: Leon Gleser, University of Pittsburgh

Moderator: Michele Carey, AT&T

Speaker: Dennis Cook, University of Minnesota

Topic: Graphical Regression

Discussant: Burt Gunter, Consultant

Moderator: Al Kalantar, University of Alberta, Canada

Speaker: Steve Brown, University of Delaware

Topic: Chemometric Applications of Neural Nets in Classification and Calibration

Discussant: Brian Ripley, Cambridge University, UK

Moderator: Margaret Nemeth, Monsanto

Speaker: Dan Wardrop and Carlos Garcia, Shell Development

Topic: Process Monitoring and Control System Evaluation

Discussant: Tom Harris, Queens University, Canada

Moderator: Steve Vardeman, Iowa State University

Speaker: David Hinkley, Oxford University, UK

Topic: Resampling in Non-parametric Modelling

Discussant: Sue Leurgans, Rush-Presbyterian St. Lukes Medical Center

Moderator: David Steinberg, Tel-Aviv University, Israel

Speaker: Jerry Sacks, NISS; Will Welch, University of Waterloo, Canada; Ken Bowman, University of Illinois at Champaign

Topic: Computer Experiments for Sensitivity Analysis and Prediction Applied to Atmospheric Models

Discussant: John Flueck, University of Nevada

Moderator: Carolyn Morgan, General Electric

 

Speaker: Dave Stevens, Hoechst-Celanese

Topic: Process Optimization by Combining RSM and PLS

Discussant: Barry Wise, Battelle.

Moderator: Svante Wold, Umea University, Sweden

Speaker: Don Marquardt, Consultant

Topic: Principles of Managing Statistical Consulting in Industry: The Example of Twin-Metric Process Control

Discussant: Gerry Hahn, General Electric

Moderator: Joe Voelkel, Rochester Institute of Technology

Conference Portrait