1997 Fall Technical Conference Program

1997 Fall Technical Conference Program

Thursday 7:30- Registration desk opens
Thursday 8:00-9:00 WELCOME / PLENARY SESSION
Topic: Quality, The Future and You
Speaker: Steven P. Bailey, ASQC President, DuPont Company
Welcome: Kymm Hockman, DuPont Company
Thursday 9:15-10:00 A. Case Study DOE B. Customer Satisfaction C. Outliers
A Case Study in DOE in the Manufacture of Film
Stephen J. Caffrey, Eastman Kodak Co.

Moderator: Wayne Taylor, Baxter Healthcare
Analyzing Customer-Satisfaction Data Using Dual Scaling
Daniel R. Lawrence, Rochester Institute of Technology

Moderator: Janice Shade, Nabisco, Inc.
Identifying Multiple Outliers and Influential Subsets in Linear Regression: A Clustering Approach
David M. Sebert, Intel; Douglas C. Montgomery, Dwayne A. Rollier, Arizona State University

Moderator: Bob Brill, Monsanto Chemical Group
Thursday 10:00-10:30 COFFEE BREAK
Thursday 10:30-12:00 A. Reliability and Measurement B. Data Mining C. Analysis of Experiments
Attributes of a Successful Reliability Improvement Metric
John A. Conte, PE, DSC Communications

Measurement Error Studies Using Sequential Sampling
Richard W. Andrews, University of Michigan and Andrew J. Barnett, Ford Motor Company

Moderator: Michael D. Mead, Newport News Shipbuilding
Statistical Process Control for Massive Datasets
George C. Runger, Arizona State University; Thomas R. Willemain, Rensselaer Polytechnic Institute; James. M. Grayson, Augusta College; William M. Messina, Chrysler Huntsville Electronics Division

Estimate of the Size Distributions of Particles: A Data Mining Success
Walter Liggett, Robert Fletcher, NIST

Moderator: Christine Mastangelo, University of Virginia
Follow-up Designs That Make the Most of An Initial Screening Experiment
Robert W. Mee, Univeristy of Tennesee

Identifying Ridge Behavior in Response Surfaces
Bruce Ankenman, Northwestern University; Soren Bisgaard, University of Wisconsin-Madison

Moderator: Dragan Kornicer, J.M. Huber Corp.
Thursday 12:15-1:45 LUNCHEON
Topic: TBD
Speaker: TBD
Presiding: Marvin D. Young, Philip Morris, USA
Thursday 2:00-3:30 A. Quality Management B. JQT Session C. Sequential Experimentation
The Fuzzy Front End of the New Product Development Process
Ken Scheffel, Thomas Hsiang, Universal Foods Corporation

Polishing the Gems
Mike Donnelly, The Dow Chemical Company

Moderator: Van Bowen, University of Richmond
Design of Multi-Level Fractional-Factorial Experiments
Thomas C. Bingham, Boeing Commercial Airplane Group

Estimating Common-Cause Sigma in the Presence of Special Causes
Russell A. Boyles, Statistical Consultant

Moderators: Douglas C. Montgomery, JQT Editor, Arizona State University; and G. Geoffrey Vining, Incoming JQT Editor, University of Florida
Sequential Simplex Design Modifications and New Applications
George Seliger, PhD, Trilogy Corporation; Boris Khurgin, Anvical-Simplex

Sequential Experimental Designs for Sensitivity Experiments
Joseph O. Voelkel, Rochester Institute of Technology

Moderator: Josef Schmee, Union College
Thursday 4:00-5:00 W. J. YOUDEN ADDRESS
Topic: Contexts of Statistical Practice
Speaker: Gipsie Ranney, Massey Graduate School of Business, Belmont University
Presiding: Don Emerling, Imation Corp.

Friday 8:00 Registration Desk Opens
Friday 8:30-10:00 A. Multi-Response Optimization B. Sources of Variation C. Optimization
Response Surface Methods and the Use of Noise Variables
Krist Giffiths, Eli Lilly & Co.; Raymond H. Myers, Virginia Tech

Multi-Response Optimization Techniques: Role of Response Variance on the Optimum
Kurt Wurl, Rutgers University

Moderator: John Dafin, Corning, Inc.
Variation Reduction in Multi-Stage Processes
R. Agrawal, G.E. Corporate Research and Development; J.F. Lawless, R.J. MacKay, University of Waterloo

Identifying Sources of Variation in Sheet Metal Stamping
Karl D. Majeske, Jay Barton, Patrick Hammett, University of Michigan

Moderator: David Rumpf, GE Aircraft Engines
A Data-Analytic Approach to Global Optimization
Matthias Schonlau, William J. Welch, University of Waterloo; Donald Jones, General Motors

Simulation-Based Optimization of Complex Processes Via The Simultaneous Perturbation Method
James C. Spall, The Johns Hopkins University

Moderator: Peter Fortini, Cytec Industries
Friday 10:00-10:30 COFFEE BREAK
Friday 10:30-12:00 A. Process Control B. Measurement C. Technometrics Session
Applying Technology to Control Process Control
Douglas Wreath, Wreath Group

Simplified Method for Economic Control Chart Design
Michael D. Mead, Newport News Shipbuilding

Moderator: Robert Austin, Houghton International Inc.
Implementing GR&R for a Semiconductor Wafer Fab Start UP
Joseph Conklin, Jennifer Trittschuh, TwinStar Semiconductor

ESD and Q-Q Plot: Two Prerequisite Statistical Treatment for Interlaboratory Exchange Data
Alex T.C. Lau, Imperial Oil, Canada

Moderator: Bryan Olin, The Proctor and Gamble Company
A Systematic Approach to the Analysis of Complex Interaction Patterns in a 2-level Factorial Design
James J. Filliben, NISI; Ker-Chau Li, UCLA

Monitoring Water Map Data from Integrated Circuit Fabrication Processes for Spacial Clustered Defects
Mark H. Hansen, Bell Laboratories - Lucent Technologies; Vijayan N. Nair, University of Michigan; David J. Friedman, Integral, Inc.

Moderator: Max D. Morris, Editor Technometrics, Oak Ridge National Laboratory
Friday 12:15-1:45 LUNCHEON
Topic: Massice Data Problems
Speaker: Jon Kettenring, ASA President, Bellcore
Presiding: Greg Piepel, Battelle-Northwest
Friday 2:00-3:30 A. Design of Experiments B. Health Care C. Multivariate Process Control
Finding Winning Combinations with Hyper-Graeco-Latin Squares
James L. Hansen, Union Carbide Technical Center

Running Experiments with Multiple Error Terms - How an Experiment is Run is Important
James M. Lucas, J.M. Lucas and Associates; Malcom C. Hazel, Drexel University

Moderator: Jim Stuart, Eastman Chemical Company
The Role of Performace Measurement in Assuring Managed Care Quality
Randall K. Spoer, NYL Care Health Plans, Inc.

Health Care Quality Tools, Techniques and Applications
David Simmons, Health Care Engineering, Inc.

Moderator: Melvin Alexander, GloboMax
Modelling and Monitoring of Multivariable Dynamical Systems under Feedback Via Canonical Variate Analysis
Wallace E. Larimore, Adaptics, Inc.; Dale E. Seborg, Yi Wang, University of California

Nonparametric Control Procedures for Multivariate Processes
Carlos D. Paternina, Eduardo Lerin, Tapas K. Das, University of South Florida

Moderator: Stefan Steiner, University of Waterloo

Officers of Sponsoring Organizations

ASQ - C&PID ASQ - Stat ASA - SPES
Chair: Marvin D. Young, Phillip Morris USA
Chair-Elect: Kymm Hockman, DuPont Company
Secretary: Dorothy Sempolinski, Corning Inc.
Treasurer: William H. Ochs, Quantum Chemical Co.
Chair: Don Emerling, Imation Corp
Chair-Elect: Do Williams, Process Improvement Consultants
Secretary: Bob Mitchell, 3M
Treasurer: Janice Shade, Nabisco, Inc.
Chair: Greg Piepel, Battelle-Northwest
Chair-Elect: John Cornell, University of Florida
Secretary/Treasurer: Kim Erland Vukovinsky, Pratt & Whitney

1997 Fall Technical Conference Committee

General Conference Chair: Kymm Hockman, DuPont Company
Local Conference Chair: Pete Kosmides, Northrop Grumman
Treasurer: Mary Ann Gorko, DuPont Merck
Registration: Marg Bailey, Patterson-Schwartz
Host Committee: Melvin Alexander, GloboMax
Randy Bright, EAI Corp.
Lloyd Dixon, Northrop Grumman
Beth Reigel, Environmental Elements
Frank Vojik, SCM Chemicals
Program Committee: Sharon Fronheiser, Eastman Kodak Co. (ASQ-C&PID)
Randy Tobias, SAS Institute, Inc. (ASA-SPES)
Susan Albin, Rutgers University (ASQ-STAT)